An edition of A simple method of obtaining concentration depth-profiles from X-ray diffraction (1984)

A simple method of obtaining concentration depth-profiles from X-ray diffraction

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A simple method of obtaining concentration de ...
by K.E. Wiedemann, J. Unnam.
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January 19, 2010 | History
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An edition of A simple method of obtaining concentration depth-profiles from X-ray diffraction (1984)

A simple method of obtaining concentration depth-profiles from X-ray diffraction

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Metallurgical Society of AIME, National Aeronautics and Space Administration, National Technical Information Service, distributor
Language
English

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Subjects
Convolution integrals, Diffraction patterns, X ray diffraction, Luminous intensity, Depth measurement
Edition Availability
Cover of: A simple method of obtaining concentration depth-profiles from X-ray diffraction
A simple method of obtaining concentration depth-profiles from X-ray diffraction
1984, Metallurgical Society of AIME, National Aeronautics and Space Administration, National Technical Information Service, distributor
Microform in English
  • Not in Library

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Book Details

Edition Notes

Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1986] 1 microfiche.

Published in
Warrendale, PA, [Washington, DC, Springfield, Va
Series
NASA contractor report -- NASA CR-176262., TMS paper selection -- paper no. F84-15.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL15417467M

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January 19, 2010 Edited by WorkBot add subjects and covers
December 11, 2009 Created by WorkBot add works page