An edition of Error analysis and calibration uncertainty of capacitance standards at NIST
(2000)
Error analysis and calibration uncertainty of capacitance standards at NIST
by Y. May Chang
- 0 Ratings
- 0 Want to read
- 0 Currently reading
- 0 Have read
Share
×Close
This edition doesn't have a description yet. Can you add one?
Publish Date
2000
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,
For sale by the Supt. of Docs., U.S. G.P.O.
Language
English
Buy this book
Subjects
Capacitance meters, Calibration, Electric capacity, StandardsPlaces
United States| Edition | Availability |
|---|---|
1
Error analysis and calibration uncertainty of capacitance standards at NIST
2000, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform
in English
|
aaaa
|
|
2
Error Analysis and Calibration Uncertainty of Capacitance Standards at NIST
2000, United States Government Printing Office
in English
0160590639 9780160590634
|
zzzz
Libraries near you:
WorldCat
|
Book Details
Edition Notes
Shipping list no.: 2000-0465-M.
"January 2000."
Includes bibliographical references (p. 38-39).
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000 2 microfiches : negative.
The Physical Object
ID Numbers
Community Reviews (0)
Feedback?
| January 20, 2010 | Edited by WorkBot | add subjects and covers |
| December 11, 2009 | Created by WorkBot | add works page |