An edition of Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system (1990)

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

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Analog-digital simulation of transient-induce ...
Victor A. Carreño
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Last edited by WorkBot
January 20, 2010 | History
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An edition of Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system (1990)

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

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Publish Date
Publisher
National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, National Technical Information Service, distributor]
Language
English

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Subjects

Logic programming, Fault tolerance, Digital simulation, Latch-up, Analog simulation, Error analysis, Single event upsets

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Edition Availability
Cover of: Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
1990, National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, National Technical Information Service, distributor]
Microform in English
  • Not in Library
Cover of: Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
1990, National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, National Technical Information Service, distributor]
Microform in English

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Book Details

Edition Notes

Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1991] 1 microfiche.

Published in
[Washington, DC], [Springfield, Va
Series
NASA technical memorandum -- 4241.
Other Titles
Analog digital simulation of transient induced logic errors and upset susceptibility of an advanced control system.

The Physical Object

Format
Microform
Pagination
1 v.

ID Numbers

Open Library
OL18077194M

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January 20, 2010 Edited by WorkBot add subjects and covers
December 11, 2009 Created by WorkBot add works page