An edition of Apparatus for electrical measurements of thin films from 77 to 1000 K (1986)

Apparatus for electrical measurements of thin films from 77 to 1000 K

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Apparatus for electrical measurements of thin ...
Lawrence Gerard Matus
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Last edited by WorkBot
January 21, 2010 | History
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An edition of Apparatus for electrical measurements of thin films from 77 to 1000 K (1986)

Apparatus for electrical measurements of thin films from 77 to 1000 K

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Publish Date
Publisher
National Aeronautics and Space Administration, Lewis Research Center
Language
English

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Subjects

Thin films, Electrical measurement, Samples, Measurement, Electricity, Mounting, Test equipment
Edition Availability
Cover of: Apparatus for electrical measurements of thin films from 77 to 1000 K
Apparatus for electrical measurements of thin films from 77 to 1000 K
1986, National Aeronautics and Space Administration, Lewis Research Center
Microform in English

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Book Details

Edition Notes

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1986. 1 microfiche.

Published in
[Cleveland, Ohio
Series
NASA technical memorandum -- 87256.

The Physical Object

Format
Microform
Pagination
1 v.

Edition Identifiers

Open Library
OL16151251M

Work Identifiers

Work ID
OL11674235W

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History

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January 21, 2010 Edited by WorkBot add subjects and covers
December 11, 2009 Created by WorkBot add works page