An edition of Data-driven methods for fault detection and diagnosis in chemical processes
(2000)
Data-driven methods for fault detection and diagnosis in chemical processes
by Evan Russell, Evan L. Russell, Leo H. Chiang, and Richard D. Braatz
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Subjects
Chemical process control, Data processing, Fault location (Engineering), Data capture & analysis, Industrial chemistry, Technology, Engineering - Industrial, Chemical Engineering Operations, Reliability Engineering, Technology & Industrial Arts, Science/Mathematics, Computer Science, Engineering - Chemical & Biochemical, Computers-Computer Science, Science / Chemistry / Technical & Industrial, Technology / Engineering / Chemical & Biochemical, Technology-Engineering - Industrial, Quality Control, Production engineering, Chemical processes| Edition | Availability |
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Data-driven Methods for Fault Detection and Diagnosis in Chemical Processes (Advances in Industrial Control)
March 30, 2000, Springer
Hardcover
in English
- 1 edition
1852332581 9781852332587
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2
Data-driven methods for fault detection and diagnosis in chemical processes
2000, Springer
in English
1852332581 9781852332587
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Book Details
Edition Notes
Includes bibliographical references (p. [175]-187) and index.
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| December 24, 2021 | Edited by ImportBot | import existing book |
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL12241701W |
| January 22, 2010 | Edited by WorkBot | add more information to works |
| December 11, 2009 | Created by WorkBot | add works page |