An edition of Secondary ion mass spectrometry
(1984)
Secondary ion mass spectrometry
SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
by International Conference on Secondary Io..., A. Benninghoven, J. Okano, R. Shimizu, and H. W. Werner
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Secondary ion mass spectrometry: SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
1984, Springer-Verlag
in English
038713316X 9780387133164
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Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan (Springer Series in Chemical Physics 36)
May 1984, Springer Verlag
Textbook Binding
038713316X 9780387133164
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Includes bibliographies and index.
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL12298182W |
| January 23, 2010 | Edited by WorkBot | add more information to works |
| December 11, 2009 | Created by WorkBot | add works page |