Characterization of semiconductor materials

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Last edited by Michel T. Talbot
April 2, 2020 | History

Characterization of semiconductor materials

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Publish Date
Publisher
McGraw-Hill
Language
English
Pages
351

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Previews available in: English

Book Details


Edition Notes

Published in
New York, Maidenhead
Series
Electronics Series

Classifications

Dewey Decimal Class
537.6/22
Library of Congress
QC612.S4

The Physical Object

Pagination
xvi,351p. :
Number of pages
351

Edition Identifiers

Open Library
OL18705191M
Internet Archive
characterization0000kane
ISBN 10
0070332738
OCLC/WorldCat
471790559
Goodreads
7166586

Work Identifiers

Work ID
OL12505469W

Source records

Internet Archive item record

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History

Download catalog record: RDF / JSON
April 2, 2020 Edited by Michel T. Talbot Added new cover
October 28, 2018 Edited by ImportBot import existing book
January 23, 2010 Edited by WorkBot add more information to works
December 11, 2009 Created by WorkBot add works page