An edition of Interferometry XV (2010)

Interferometry XV

Techniques and analysis : 2-4 August 2010, San Diego, California, United States

by , , and

Interferometry XV
Catherine E. Towers, Joanna Sc ...
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Last edited by LC Bot
October 22, 2011 | History
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An edition of Interferometry XV (2010)

Interferometry XV

Techniques and analysis : 2-4 August 2010, San Diego, California, United States

by , , and

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Publish Date
Publisher
SPIE
Language
English

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Subjects

Industrial applications, Interferometry, Congresses, Metrology, Measurement
Edition Availability
Cover of: Interferometry XV
Interferometry XV: Techniques and analysis : 2-4 August 2010, San Diego, California, United States
2010, SPIE
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Bellingham, Wash
Series
Proceedings of SPIE -- v. 7790, Proceedings of SPIE--the International Society for Optical Engineering -- v. 7790.
Other Titles
Interferometry 15, Interferometry fifteen

Classifications

Library of Congress
TA1555 .I5895 2010

The Physical Object

Pagination
1 v. (various pagings) :

ID Numbers

Open Library
OL25006186M
ISBN 10
0819482862
ISBN 13
9780819482860
LCCN
2011290484
OCLC/WorldCat
671647632

Source records

Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record
Library of Congress MARC record

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October 22, 2011 Edited by LC Bot import new book
October 20, 2011 Created by LC Bot import new book