Aberration-corrected analytical transmission electron microscopy

Locate

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today


Buy this book

Last edited by ImportBot
September 17, 2021 | History

Aberration-corrected analytical transmission electron microscopy

"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--

"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--

Publish Date
Publisher
Wiley
Language
English

Buy this book

Previews available in: English

Edition Availability
Cover of: Aberration-Corrected Analytical Transmission Electron Microscopy
Aberration-Corrected Analytical Transmission Electron Microscopy
2011, Wiley & Sons, Incorporated, John
in English
Cover of: Aberration-Corrected Analytical Transmission Electron Microscopy
Aberration-Corrected Analytical Transmission Electron Microscopy
2011, Wiley & Sons, Limited, John
in English
Cover of: Aberration-Corrected Analytical Transmission Electron Microscopy
Aberration-Corrected Analytical Transmission Electron Microscopy
2011, Wiley & Sons, Incorporated, John
in English
Cover of: Aberration-corrected analytical transmission electron microscopy
Aberration-corrected analytical transmission electron microscopy
2011, Wiley
in English
Cover of: Aberration-Corrected Analytical Transmission Electron Microscopy
Aberration-Corrected Analytical Transmission Electron Microscopy
2011, Wiley & Sons, Incorporated, John
in English

Add another edition?

Book Details


Edition Notes

Includes bibliographical references and index.

Published in
Hoboken, N.J

Classifications

Dewey Decimal Class
502.8/25
Library of Congress
QH212.T7 A24 2011, QH212.T7

The Physical Object

Pagination
p. cm.

ID Numbers

Open Library
OL25328911M
Internet Archive
aberrationcorrec00bryd
ISBN 13
9780470518519
LCCN
2011019731

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
September 17, 2021 Edited by ImportBot import existing book
September 25, 2020 Edited by MARC Bot import existing book
May 30, 2012 Created by LC Bot import new book