An edition of IDDQ testing of VLSI circuits (1992)

IDDQ testing of VLSI circuits

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Cover of: IDDQ testing of VLSI circuits by Ravi K. Gulati
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Last edited by ImportBot
February 25, 2022 | History
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An edition of IDDQ testing of VLSI circuits (1992)

IDDQ testing of VLSI circuits

by

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Publish Date
Publisher
Kluwer Academic Publishers
Language
English
Pages
120

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Subjects

Complementary Metal oxide semiconductors, Very large scale integration, Testing, Integrated circuits, Iddq testing, Integrated circuits, very large scale integration, Metal oxide semiconductors, complementary
Edition Availability
Cover of: IDDQ testing of VLSI circuits
IDDQ testing of VLSI circuits
1993, Kluwer Academic Publishers
in English
Cover of: IDDQ Testing of VLSI Circuits (Frontiers in Electronic Testing Series)
IDDQ Testing of VLSI Circuits (Frontiers in Electronic Testing Series)
December 31, 1992, Springer
Hardcover in English - 1 edition

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Book Details

Edition Notes

Includes bibliographical references and index.
"A Special issue of Journal of electronic testing: theory and applications."
"Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4."
DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing.

Published in
Boston
Series
Frontiers in electronic testing

Classifications

Dewey Decimal Class
621.39/5
Library of Congress
TK7874 .I3223 1993, QA75.5-76.95

The Physical Object

Pagination
120 p. :
Number of pages
120

Edition Identifiers

Open Library
OL1735011M
ISBN 10
0792393155
LCCN
92039926
Goodreads
2292531

Work Identifiers

Work ID
OL18276317W

Source records

Scriblio MARC record
Library of Congress MARC record
Library of Congress MARC record
Better World Books record

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History

Download catalog record: RDF / JSON
February 25, 2022 Edited by ImportBot import existing book
November 15, 2020 Edited by MARC Bot import existing book
February 5, 2019 Created by MARC Bot import existing book