An edition of Electron beam testing technology (1993)

Electron beam testing technology

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Cover of: Electron beam testing technology by John T. L. Thong
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Last edited by ImportBot
October 4, 2021 | History
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An edition of Electron beam testing technology (1993)

Electron beam testing technology

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Publish Date
Publisher
Plenum Press
Language
English
Pages
462

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Subjects

Electron beams, Semiconductors, Testing, Industrial applications, Scanning electron microscopes, Particle beams
Edition Availability
Cover of: Electron beam testing technology
Electron beam testing technology
1993, Plenum Press
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
New York
Series
Microdevices

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7871.85 .E426 1993, QC1-75

The Physical Object

Pagination
xvi, 462 p. :
Number of pages
462

ID Numbers

Open Library
OL1409878M
ISBN 10
0306443600
LCCN
93018555
OCLC/WorldCat
27725615
Goodreads
3843524

Source records

Scriblio MARC record
Library of Congress MARC record
Library of Congress MARC record
Better World Books record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
October 4, 2021 Edited by ImportBot import existing book
November 16, 2020 Edited by MARC Bot import existing book
February 5, 2019 Created by MARC Bot import existing book