Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425C̊

Surface and interface study of PdCr/SiC schot ...
Lewis Research Center
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Last edited by MARC Bot
February 7, 2019 | History

Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425C̊

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Cover of: Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425C̊
Surface and interface study of PdCr/SiC schottky diode gas sensor annealed at 425C̊
1998, National Aeronautics and Space Administration, Lewis Research Center, National Technical Information Service, distributor
Microform in English

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Book Details


Edition Notes

Shipping list no.: 99-0384-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1998] 1 microfiche.

Published in
[Cleveland, Ohio], Springfield, Va
Series
[NASA technical memorandum] -- NASA/TM-1998-107429., NASA technical memorandum -- 107429.

The Physical Object

Format
Microform
Pagination
1 v.

Edition Identifiers

Open Library
OL17838677M
OCLC/WorldCat
41148977

Work Identifiers

Work ID
OL18473842W

Source records

Oregon Libraries MARC record

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February 7, 2019 Created by MARC Bot import existing book