Two- and three-dimensional vision systems for inspection, control, and metrology

29-30 October 2003, Providence, Rhode Island, USA

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Last edited by MARC Bot
January 8, 2023 | History

Two- and three-dimensional vision systems for inspection, control, and metrology

29-30 October 2003, Providence, Rhode Island, USA

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Publish Date
Publisher
SPIE
Language
English
Pages
214

Buy this book

Previews available in: English

Book Details


Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash. USA
Series
SPIE proceedings series ;, v. 5265, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5265.
Genre
Congresses.

Classifications

Library of Congress
TA1634 .T942 2004, TA1634.T942 2004

The Physical Object

Pagination
v, 214 p. :
Number of pages
214

ID Numbers

Open Library
OL3328332M
Internet Archive
twothreedimensio5265unse
ISBN 10
0819451533
LCCN
2004303010
OCLC/WorldCat
54763056

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History

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January 8, 2023 Edited by MARC Bot import existing book
September 9, 2021 Edited by ImportBot import existing book
February 18, 2019 Created by MARC Bot import existing book