An edition of Measurement and effects of surface defects and quality of polish (1985)

Measurement and effects of surface defects and quality of polish

January 21-22, 1985, Los Angeles, California

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Cover of: Measurement and effects of surface defects and quality of polish by L. R. Baker
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Last edited by MARC Bot
February 18, 2019 | History
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An edition of Measurement and effects of surface defects and quality of polish (1985)

Measurement and effects of surface defects and quality of polish

January 21-22, 1985, Los Angeles, California

by

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Publish Date
Publisher
SPIE--the International Society for Optical Engineering
Language
English
Pages
198

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Previews available in: English

Subjects

Congresses, Defects, Lenses
Edition Availability
Cover of: Measurement and effects of surface defects and quality of polish
Measurement and effects of surface defects and quality of polish: January 21-22, 1985, Los Angeles, California
1985, SPIE--the International Society for Optical Engineering
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographies and index.

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE--the International Society for Optical Engineering ;, v. 525

Classifications

Dewey Decimal Class
681/.423
Library of Congress
TS517.3 .M43 1985

The Physical Object

Pagination
vi, 198 p. :
Number of pages
198

ID Numbers

Open Library
OL2553170M
Internet Archive
measurementeffec0525unse
ISBN 10
0892525606
LCCN
85050425

Source records

Scriblio MARC record
Library of Congress MARC record
Internet Archive item record

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February 18, 2019 Created by MARC Bot import existing book