An edition of Testing, reliability, and application of micro- and nano-material systems
(2003)
Testing, reliability, and application of micro- and nano-material systems
3-5 March, 2003, San Diego, California, USA
by Norbert Meyendorf and George Y. Baaklini
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![Cover of: Testing, reliability, and application of micro- and nano-material systems by Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering.](http://covers.openlibrary.org/b/id/4248872-L.jpg)
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Testing, reliability, and application of micro- and nano-material systems: 3-5 March, 2003, San Diego, California, USA
2003, SPIE
in English
0819448508 9780819448507
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Includes bibliographical references and author index.
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| February 19, 2019 | Created by MARC Bot | import existing book |