An edition of Optical characterization techniques for semiconductor technology (1981)

Optical characterization techniques for semiconductor technology

April 1-2, 1981, San Jose, California

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Cover of: Optical characterization techniques for semiconductor technology by Roy F. Potter
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Last edited by ImportBot
July 28, 2023 | History
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An edition of Optical characterization techniques for semiconductor technology (1981)

Optical characterization techniques for semiconductor technology

April 1-2, 1981, San Jose, California

by

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Publish Date
Publisher
Society of Photo-optical Instrumentation Engineers
Language
English
Pages
262

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Previews available in: English

Subjects

Optical methods, Semiconductors, Testing, Congresses
Edition Availability
Cover of: Optical characterization techniques for semiconductor technology
Optical characterization techniques for semiconductor technology: April 1-2, 1981, San Jose, California
1981, Society of Photo-optical Instrumentation Engineers
in English

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Book Details

Edition Notes

Includes bibliographical references and indexes.

Published in
Bellingham, Wash
Series
Proceedings of the Society of Photo-optical Instrumentation Engineers ;, v. 276

Classifications

Dewey Decimal Class
621.3815/2/0287
Library of Congress
TK7871.85 .O6

The Physical Object

Pagination
x, 262 p. :
Number of pages
262

ID Numbers

Open Library
OL3787004M
Internet Archive
isbn_0892523093_276
ISBN 10
0892523093
LCCN
81051404
OCLC/WorldCat
7472758

Source records

Scriblio MARC record
Library of Congress MARC record
marc_columbia MARC record
Internet Archive item record

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July 28, 2023 Edited by ImportBot import existing book
March 10, 2019 Created by MARC Bot import existing book