An edition of Machine vision and three-dimensional imaging systems for inspection and metrology II (2002)

Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

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Machine vision and three-dimensional imaging ...
Kevin G. Harding
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Last edited by ImportBot
July 31, 2020 | History
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An edition of Machine vision and three-dimensional imaging systems for inspection and metrology II (2002)

Machine vision and three-dimensional imaging systems for inspection and metrology II

29-30 October 2001, Boston, [Massachusetts] USA

by

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Publish Date
Publisher
SPIE
Language
English
Pages
236

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Subjects

Optical methods, Computer vision, Quality control, Congresses, Metrology, Industrial applications, Three-dimensional display systems, Quality control, statistical methods, Measurement

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Edition Availability
Cover of: Machine vision and three-dimensional imaging systems for inspection and metrology II
Machine vision and three-dimensional imaging systems for inspection and metrology II: 29-30 October 2001, Boston, [Massachusetts] USA
2002, SPIE
in English
  • Not in Library
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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Washington
Series
SPIE proceedings series ;, v. 4567, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 4567.
Genre
Congresses.

Classifications

Dewey Decimal Class
681/.25
Library of Congress
TA1634 .M316 2002, TA1634.M316 2002

The Physical Object

Pagination
ix, 236 p. :
Number of pages
236

ID Numbers

Open Library
OL3584785M
ISBN 10
081944295X
LCCN
2002283059
OCLC/WorldCat
49535329
Goodreads
3508226

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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History

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July 31, 2020 Edited by ImportBot import existing book
March 11, 2019 Created by MARC Bot import existing book