An edition of Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits) (1981)

Reliability and degradation

semiconductor devices and circuits

by and

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Cover of: Reliability and degradation by edited by M.J. Howes, D.V. Morgan.
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Last edited by MARC Bot
December 8, 2022 | History
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An edition of Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits) (1981)

Reliability and degradation

semiconductor devices and circuits

by and

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
J. Wiley
Language
English
Pages
444

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Previews available in: English

Subjects
Semiconductors, Reliability, Solid state electronics, Integrated circuits

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Edition Availability
Cover of: Reliability and degradation
Reliability and degradation: semiconductor devices and circuits
1981, J. Wiley
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Chichester, New York
Series
The Wiley series in solid state devices and circuits

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .R44 1981, TK7871.85

The Physical Object

Pagination
xii, 444 p. :
Number of pages
444

ID Numbers

Open Library
OL4116866M
Internet Archive
reliabilitydegra0000unse
ISBN 10
0471280283
LCCN
80042310
OCLC/WorldCat
8092994
Goodreads
4143699

Source records

amazon.com record
Scriblio MARC record
Internet Archive item record
Library of Congress MARC record
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marc_columbia MARC record

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History

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December 8, 2022 Edited by MARC Bot import existing book
October 18, 2022 Edited by ImportBot import existing book
April 3, 2019 Edited by MARC Bot import existing book
March 18, 2019 Created by ImportBot import existing book