An edition of Physics of thin films
(1994)
Advances in Research and Development: Optical Characterization of Real Surfaces and Films, Volume 19
Optical Characterization of Real Surfaces and Films (Thin Films)
by K. Vedam
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Thin filmsShowing 2 featured editions. View all 2 editions?
| Edition | Availability |
|---|---|
1
Physics of thin films: advances in research and development.
1994, Academic Press
in English
0125330197 9780125330190
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2
Advances in Research and Development: Optical Characterization of Real Surfaces and Films, Volume 19: Optical Characterization of Real Surfaces and Films (Thin Films)
November 18, 1994, Academic Press
Hardcover
in English
0125330197 9780125330190
|
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"The measurement of surface anisotropy of semiconductors under normal incidence has recently emerged as a very attractive technique."
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| July 31, 2020 | Edited by ImportBot | import existing book |
| April 2, 2019 | Created by MARC Bot | import existing book |