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Edition | Availability |
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1
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October 2004, Philadelphia, Pennsylvania, USA
2005, SPIE
in English
0819455598 9780819455598
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2
Two- and three-dimensional vision systems for inspection, control, and metrology II: 26-27 October, 2004, Philadelphia, Pennsylvania, USA
2004, SPIE
in English
0819455598 9780819455598
|
aaaa
|
Book Details
Edition Notes
Includes bibliographical references and author index.
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