Two- and three-dimensional vision systems for inspection, control, and metrology II

26-27 October, 2004, Philadelphia, Pennsylvania, USA

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Last edited by MARC Bot
December 11, 2020 | History

Two- and three-dimensional vision systems for inspection, control, and metrology II

26-27 October, 2004, Philadelphia, Pennsylvania, USA

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Publish Date
Publisher
SPIE
Language
English
Pages
188

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Book Details


Edition Notes

Includes bibliographical references and author index.

Published in
Bellingham, Wash
Series
SPIE proceedings series ;, v. 5606, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 5606.
Genre
Congresses.

Classifications

Library of Congress
TA1634 .T94 2004, TA1634.T94 2004

The Physical Object

Pagination
vii, 188 p. :
Number of pages
188

ID Numbers

Open Library
OL3439354M
ISBN 10
0819455598
LCCN
2005298675
OCLC/WorldCat
57543567
Goodreads
5703323

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December 11, 2020 Edited by MARC Bot import existing book
August 1, 2020 Edited by ImportBot import existing book
April 2, 2019 Created by MARC Bot import existing book