An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

Cover of: Machine vision systems for inspection and metrology VIII by Bruce G. Batchelor
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Last edited by MARC Bot
April 2, 2019 | History
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An edition of Machine vision systems for inspection and metrology VIII (1999)

Machine vision systems for inspection and metrology VIII

21-22 September 1999, Boston, Massachusetts

by

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Publish Date
Publisher
SPIE
Language
English
Pages
252

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Subjects

Computer vision, Congresses, Optical measurements, Engineering inspection, Industrial applications, Automation

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Edition Availability
Cover of: Machine vision systems for inspection and metrology VIII
Machine vision systems for inspection and metrology VIII: 21-22 September 1999, Boston, Massachusetts
1999, SPIE
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographic references and author index.

Published in
Bellingham, Wash., USA
Series
Proceedings of SPIE ;, v. 3836, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3836.
Genre
Congresses.

Classifications

Dewey Decimal Class
670.42/5
Library of Congress
TA1634 .M3356 1999, TA1634.M3356 1999

The Physical Object

Pagination
vii, 252 p. :
Number of pages
252

ID Numbers

Open Library
OL6803717M
ISBN 10
0819434299
LCCN
00266009
OCLC/WorldCat
42709399
Goodreads
768850

Source records

Scriblio MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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April 2, 2019 Created by MARC Bot import existing book