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Laser interferometry, quantitative analysis of interferograms: third in a series : 7-9 August 1989, San Diego, California
1990, SPIE
in English
0819401986 9780819401984
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Edition Notes
Includes bibliographical references and index.
"Part of a four-conference program o n Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11-August 1989, in San Diego, California"--P. vii.
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Feedback?July 26, 2024 | Edited by MARC Bot | import existing book |
April 3, 2019 | Created by MARC Bot | import existing book |