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Previews available in: English
Subjects
Semiconductors, Dielectrics, Defects, Laser beamsEdition | Availability |
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1
Laser techniques for investigation of defects semiconductors and dielectrics
1988, Nova Science Publishers
in English
0941743152 9780941743150
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Book Details
Table of Contents
Investigation of impurity centers in semiconductors by IR-laser emission scattering technique / V.P. Kalinushkin
Defect formation by intense optical excitation of alkali-halide crystals with mercury-like ions / V.P. Danilov
Laser excitation of nonequilibrium carriers in wideband dielectrics / B.G. Gorshkov ... [et al.].
Edition Notes
Includes bibliographies and index.
Translation of: Lazernye metody issledovaniĭ defektov v poluprovodnikakh i diėlektrikakh.
Title on p. facing t.p. in listing of vols. of series: Laser methods of defect investigations in semiconductors and dielectrics.
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The Physical Object
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