Laser techniques for investigation of defects semiconductors and dielectrics

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April 3, 2019 | History

Laser techniques for investigation of defects semiconductors and dielectrics

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Publish Date
Language
English
Pages
204

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Previews available in: English

Book Details


Table of Contents

Investigation of impurity centers in semiconductors by IR-laser emission scattering technique / V.P. Kalinushkin
Defect formation by intense optical excitation of alkali-halide crystals with mercury-like ions / V.P. Danilov
Laser excitation of nonequilibrium carriers in wideband dielectrics / B.G. Gorshkov ... [et al.].

Edition Notes

Includes bibliographies and index.
Translation of: Lazernye metody issledovaniĭ defektov v poluprovodnikakh i diėlektrikakh.
Title on p. facing t.p. in listing of vols. of series: Laser methods of defect investigations in semiconductors and dielectrics.

Published in
Commack, N.Y
Series
Proceedings of the Institute of General Physics, Academy of the Sciences of the USSR,, v. 4, Trudy Instituta obshcheĭ fiziki., v. 4.
Other Titles
Laser methods of defect investigations in semicondutors and dielectrics.

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
QC611.6.D4 L3913 1988

The Physical Object

Pagination
vii, 204 p. :
Number of pages
204

ID Numbers

Open Library
OL2031066M
Internet Archive
lasertechniquesf0000unse_f6k7
ISBN 10
0941743152
LCCN
88006622
OCLC/WorldCat
17775364
Goodreads
3962143

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April 3, 2019 Created by MARC Bot import existing book