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The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
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Previews available in: English
Edition | Availability |
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1
Acoustic Scanning Probe Microscopy
2014, Springer Berlin / Heidelberg
in English
3642430791 9783642430794
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2
Acoustic Scanning Probe Microscopy
2013, Springer Berlin Heidelberg, Imprint: Springer
electronic resource /
in English
3642274943 9783642274947
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3 |
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Feedback?December 29, 2021 | Edited by ImportBot | import existing book |
June 28, 2019 | Created by MARC Bot | import new book |