Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Last edited by ImportBot
September 11, 2021 | History

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Publish Date
Publisher
Springer
Language
English
Pages
328

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Previews available in: English

Edition Availability
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Nov 10, 2010, Springer
paperback
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
2007, Springer London, Limited
in English

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Book Details


Classifications

Library of Congress
TK7888.4TK1-9971TA17, TK7871.99.M44 S23 2007

ID Numbers

Open Library
OL7445893M
Internet Archive
defectorientedte00sach_685
ISBN 10
0387465464
ISBN 13
9780387465463
OCLC/WorldCat
79447484
Library Thing
6363014
Goodreads
5028072

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History

Download catalog record: RDF / JSON
September 11, 2021 Edited by ImportBot import existing book
September 10, 2021 Edited by ImportBot import existing book
June 29, 2019 Created by MARC Bot import existing book