Electronic Properties of Semiconductor Interfaces

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Last edited by MARC Bot
June 30, 2019 | History

Electronic Properties of Semiconductor Interfaces

Almost all semiconductor devices contain metal-semiconductor, insulator-semiconductor, insulator-metal and/or semiconductor-semiconductor interfaces; and their electronic properties determine the device characteristics. This is the first monograph that treats the electronic properties of all different types of semiconductor interfaces. Using the continuum of interface–induced gap states (IFIGS) as the unifying concept, Mönch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-function tails of electron states, which overlap a semiconductor band-gap exactly at the interface, so they originate from the quantum-mechanical tunnel effect. He shows that a more chemical view relates the IFIGS to the partial ionic character of the covalent interface-bonds and that the charge transfer across the interface may be modeled by generalizing Pauling’s electronegativity concept. The IFIGS-and-electronegativity theory is used to quantitatively explain the barrier heights and band offsets of well-characterized Schottky contacts and semiconductor heterostructures, respectively.

Publish Date
Language
English
Pages
264

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Previews available in: English

Edition Availability
Cover of: Electronic Properties of Semiconductor Interfaces
Electronic Properties of Semiconductor Interfaces
2010, Springer Berlin / Heidelberg
in English
Cover of: Electronic Properties of Semiconductor Interfaces
Electronic Properties of Semiconductor Interfaces
2004
electronic resource / in English

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Book Details


Table of Contents

1. Introduction
2. Depletion Layer
3. Determination of Barrier Heights and Offsets
4. Laterally Inhomogeneous Schottky Contacts
5. The IFIGS-and-Electronegativity Theory
6. The MIGS-and-Electronegativity Concept: Experiment and Theory
7. First-Principles Calculations of Barrier Heights and Valence-Band Offsets
8. Temperature and Pressure Effects
9. Barrier Heights and Extrinsic Interface Defects
10. Extrinsic Interface Dipoles
11. Ohmic Contacts
References.

Edition Notes

Series
Springer Series in Surface Sciences -- 43

Classifications

Dewey Decimal Class
620.44
Library of Congress
TA418.7-418.76, TA418.9.T45

The Physical Object

Format
[electronic resource] /
Pagination
XI, 264 p.
Number of pages
264

ID Numbers

Open Library
OL27035050M
Internet Archive
electronicproper00mnch
ISBN 13
9783662069455

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June 30, 2019 Created by MARC Bot import new book