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Last edited by Charles Horn
August 26, 2021 | History
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Previews available in: English
Subjects
Reliability, Congresses, Integrated circuits, Wafer-scale integration, Circuits & components, Reliability engineering, c 1990 to c 2000, Technology & Industrial Arts, Engineering - Electrical & Electronic, Technology, Science/Mathematics, Electronics - Circuits - General, Electronics - MicroelectronicsShowing 3 featured editions. View all 3 editions?
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1
International Integrated Reliability Workshop Final Report Proceedings: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
February 2000, IEEE Standards Office
Unknown Binding
in English
0780348826 9780780348820
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WorldCat
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2
1998 International Integrated Reliability Workshop Final Report: Stanford Sierra Camp Lake Tahoe, California October 12-15, 1998
March 1998, Institute of Electrical & Electronics Enginee
Paperback
in English
0780348818 9780780348813
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zzzz
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WorldCat
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3
1998 IEEE International Integrated Reliability Workshop final report: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
1998, IEEE Electron Devices Society, IEEE Reliability Society
in English
0780348818 9780780348813
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aaaa
Libraries near you:
WorldCat
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Book Details
Edition Notes
Includes bibliographical references.
"IEEE Catalog No. 98TH8363"--verso of T.p.
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The Physical Object
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Feedback?August 26, 2021 | Edited by Charles Horn | merge authors |
July 31, 2019 | Edited by MARC Bot | associate edition with work OL2033865W |
July 31, 2019 | Edited by MARC Bot | associate edition with work OL2033865W |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
December 9, 2009 | Created by WorkBot | add works page |