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Last edited by Charles Horn
August 26, 2021 | History
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Previews available in: English
Subjects
Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Mathematics for scientists & engineers, Weights & Measures, Mensuration, Electronic Measurements, Mathematics, Technology & Industrial Arts, Science/Mathematics, Probability & Statistics - General, Electronics - Semiconductors, Engineering - Electrical & Electronic, ScienceEdition | Availability |
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1
Iwsm 1999 International Workshop on Statistical Metrology: June 12, 1999/Kyoto
August 1999, Institute of Electrical & Electronics Enginee
Paperback
in English
0780351541 9780780351547
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2
IWSM: 1999 4th International Workshop on Statistical Metrology : June 12, 1999, Kyoto
1999, IEEE
in English
0780351541 9780780351547
|
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Libraries near you:
WorldCat
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Book Details
Edition Notes
"IEEE Catalog Number 99TH8391"--T.p. verso.
Includes bibliographical references.
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The Physical Object
ID Numbers
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Feedback?August 26, 2021 | Edited by Charles Horn | merge authors |
July 31, 2019 | Edited by MARC Bot | associate edition with work OL2039759W |
April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
February 2, 2010 | Edited by WorkBot | add more information to works |
December 9, 2009 | Created by WorkBot | add works page |