An edition of VLSI Design and Test
(2018)
VLSI Design and Test
26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
by Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, and Santosh Kumar Vishvakarma
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| Edition | Availability |
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1
VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
2023, Springer
in English
3031215133 9783031215131
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2
VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Jan 25, 2019, Springer
paperback
9811359490 9789811359491
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3
VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Aug 17, 2019, Springer
paperback
9813297662 9789813297661
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4
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Jan 09, 2018, Springer
paperback
9811074712 9789811074714
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5
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Jan 26, 2018, Springer
paperback
9811074690 9789811074691
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| December 29, 2021 | Edited by ImportBot | import existing book |
| June 5, 2020 | Created by ImportBot | import new book |