An edition of Testing, Reliability, and Application of Micro- And Nano-Material Systems III (2005)

Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)

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Cover of: Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie) by Norbert Meyendorf, Bernd Michel
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Last edited by MARC Bot
December 14, 2020 | History
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An edition of Testing, Reliability, and Application of Micro- And Nano-Material Systems III (2005)

Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)

by and

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Publish Date
Publisher
SPIE-International Society for Optical Engine
Language
English
Pages
168

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Subjects

Optoelectronic devices, Photonics, Nanostructured materials, Electromechanical devices, Electrooptical devices, Congresses, Materials, Testing, Microelectromechanical systems
Edition Availability
Cover of: Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)
Testing, Reliability, And Application Of Micro-And Nano-Material Systems III (Proceedings of Spie)
May 30, 2005, SPIE-International Society for Optical Engine
Paperback in English

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Book Details

Classifications

Library of Congress
TA1750.T473 2005, TA1750 .T473 2005

The Physical Object

Format
Paperback
Number of pages
168
Dimensions
10.5 x 8.3 x 0.1 inches
Weight
10.4 ounces

ID Numbers

Open Library
OL11393601M
ISBN 10
0819457477
ISBN 13
9780819457479
LCCN
2006271190
Goodreads
4406786

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Better World Books record
Library of Congress MARC record

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December 14, 2020 Edited by MARC Bot import existing book
August 1, 2020 Created by ImportBot import existing book