An edition of Non-Intrusive Inspection Technologies (2006)

Non-Intrusive Inspection Technologies

17-18 April, 2006, Kissimmee, Florida USA (Proceedings of SPIE)

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Cover of: Non-Intrusive Inspection Technologies by George Vourvopoulos, F. Patrick Doty
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Last edited by MARC Bot
December 14, 2020 | History
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An edition of Non-Intrusive Inspection Technologies (2006)

Non-Intrusive Inspection Technologies

17-18 April, 2006, Kissimmee, Florida USA (Proceedings of SPIE)

by and

  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Society of Photo Optical
Language
English

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Subjects

Freight and freightage, Optical detectors, Congresses, Security measures, Inspection

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Edition Availability
Cover of: Non-Intrusive Inspection Technologies
Non-Intrusive Inspection Technologies: 17-18 April, 2006, Kissimmee, Florida USA (Proceedings of SPIE)
May 30, 2006, Society of Photo Optical
Paperback in English
  • Not in Library
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Book Details

Classifications

Library of Congress
HV8290.N66 2006, HV8290 .N66 2006

The Physical Object

Format
Paperback
Dimensions
10.7 x 8.4 x 0.6 inches
Weight
14.1 ounces

ID Numbers

Open Library
OL11393867M
ISBN 10
0819462691
ISBN 13
9780819462695
LCCN
2006285160
Goodreads
4167955

Source records

Better World Books record
Library of Congress MARC record

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History

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December 14, 2020 Edited by MARC Bot import existing book
August 2, 2020 Created by ImportBot import existing book