An edition of Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics (2014)

Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics

Volume 612

by , , , , and

Materials, Technology and Reliability for Adv ...
G. S. Oehrlein, K. Maex, S. Og ...
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Last edited by ImportBot
August 23, 2020 | History
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An edition of Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics (2014)

Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics

Volume 612

by , , , , and

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Publish Date
Publisher
University of Cambridge ESOL Examinations
Language
English
Pages
614

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Subjects

Semiconductors, Integrated circuits, Thin films
Edition Availability
Cover of: Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics
Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612
2014, University of Cambridge ESOL Examinations
in English

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Library of Congress

ID Numbers

Open Library
OL29205901M
ISBN 13
9781107413153

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August 23, 2020 Created by ImportBot import new book