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Scanning probe microscopyShowing 2 featured editions. View all 2 editions?
Edition | Availability |
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1
Atomic Force Microscopy: Principles, Developments and Applications
2018, Nova Science Publishers, Incorporated
in English
1536134953 9781536134957
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WorldCat
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2
Atomic Force Microscopy: Principles, Developments and Applications
2018, Nova Science Publishers, Incorporated
in English
1536134961 9781536134964
|
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Libraries near you:
WorldCat
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