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Edition | Availability |
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1
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford University, Stanford, California, USA August 27-31 1979
2013, Springer
in English
3642618715 9783642618710
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2
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry Stanford ...
Dec 13, 2011, Springer
paperback
3642618731 9783642618734
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Source title: Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford ... (Springer Series in Chemical Physics (9))
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