An edition of Characterization of epitaxial semiconductor films (1976)

Characterization of epitaxial semiconductor films

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Cover of: Characterization of epitaxial semiconductor films by Henry Kressel
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Last edited by MARC Bot
October 12, 2020 | History
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An edition of Characterization of epitaxial semiconductor films (1976)

Characterization of epitaxial semiconductor films

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Publish Date
Publisher
Elsevier Scientific Pub. Co.
Language
English
Pages
216

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Subjects

Semiconductors, Thin films, Epitaxy
Edition Availability
Cover of: Characterization of epitaxial semiconductor films
Characterization of epitaxial semiconductor films
1976, Elsevier Scientific Pub. Co.
in English

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Book Details

Edition Notes

Includes bibliographical references.
"Published as a special issue of Thin solid films, vol. 31, issues 1 and 2."

Published in
Amsterdam, New York
Series
Methods and phenomena, their applications in science and technology ;, v. 2

Classifications

Dewey Decimal Class
530.4/1
Library of Congress
QC176.83 .C48

The Physical Object

Pagination
xii, 216 p. :
Number of pages
216

ID Numbers

Open Library
OL4945274M
ISBN 10
044441438X
LCCN
76372967
Goodreads
5279993

Source records

Library of Congress MARC record

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October 12, 2020 Created by MARC Bot import existing book