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Subjects
X-rays, Diffraction, Amorphous substances, Structure, MeasurementEdition | Availability |
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Rentgenowska metoda badania struktury materiałów amorficznych i nanokrystalicznych
2011, Uniwersytet Śląski, Oficyna Wydawnicza Wacław Walasek
in Polish
- Wyd. 1.
8360743479 9788360743478
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Book Details
Edition Notes
Includes bibliographical references (p. [122]-128).
Summary in English and Russian.
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October 28, 2020 | Created by MARC Bot | import new book |