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October 23, 2023 | History
vii, 202 p. : 28 cm
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Previews available in: English
Subjects
Optical methods, Congresses, Optical pattern recognition, Semiconductors, Testing, Integrated circuits, Design and construction, Semiconductors -- Design and construction -- Congresses, Integrated circuits -- Design and construction -- Congresses, Semiconductors -- Testing -- Optical methods -- Congresses, Integrated circuits -- Testing -- Optical methods -- Congresses, Optical pattern recognition -- CongressesEdition | Availability |
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Optical characterization techniques for high-performance microelectronic device manufacturing: 20 October 1994, Austin, Texas
1994, SPIE
in English
0819416703 9780819416704
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Edition Notes
Includes bibliographical references and author index.
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November 18, 2020 | Created by MARC Bot | import existing book |