An edition of Metrology and Diagnostic Techniques for Nanoelectronics (2016)

Metrology and Diagnostic Techniques for Nanoelectronics

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Metrology and Diagnostic Techniques for Nanoe ...
Zhiyong Ma, David G. Seiler, Z ...
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Last edited by MARC Bot
December 15, 2022 | History
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An edition of Metrology and Diagnostic Techniques for Nanoelectronics (2016)

Metrology and Diagnostic Techniques for Nanoelectronics

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Publish Date
Publisher
Jenny Stanford Publishing
Language
English
Pages
1454

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Subjects

Electronics, Nanoelectronics, Metrology, TECHNOLOGY & ENGINEERING, Mechanical
Edition Availability
Cover of: Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
2017, Jenny Stanford Publishing
in English
Libraries near you: WorldCat
Cover of: Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
2017, Jenny Stanford Publishing
in English
  • Not in Library
Libraries near you: WorldCat
Cover of: Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
2017, Jenny Stanford Publishing
in English
Libraries near you: WorldCat
Cover of: Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
2016, Taylor & Francis Group
in English
Libraries near you: WorldCat

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Book Details

Classifications

Dewey Decimal Class
621.381

ID Numbers

Open Library
OL53256660M
ISBN 13
9781315185385

Source records

Better World Books record

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History

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December 15, 2022 Edited by MARC Bot import existing book
October 6, 2021 Created by ImportBot import new book