An edition of On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond (2019)

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

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Cover of: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond by Andrej Rumiantsev, Andrej Rumiantsev
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Last edited by MARC Bot
December 9, 2022 | History
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An edition of On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond (2019)

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

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Publish Date
Publisher
River Publishers
Language
English

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Subjects

Semiconductors, Characterization, Semiconductor wafers, Calibration, Semi-conducteurs, Caractérisation, Plaquettes à gravure en semi-conducteurs, Étalonnage, SCIENCE / Energy, TECHNOLOGY / Lasers
Edition Availability
Cover of: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
2022, River Publishers
in English
Cover of: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
2022, River Publishers
in English
Cover of: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
2022, River Publishers
in English
Cover of: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
2019, River Publishers
in English

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Book Details

The Physical Object

Pagination
156

ID Numbers

Open Library
OL40133678M
ISBN 13
9781003338994

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December 9, 2022 Edited by MARC Bot import existing book
October 6, 2021 Created by ImportBot import new book