An edition of Integrated circuit failure analysis (1998)

Integrated circuit failure analysis

a guide to preparation techniques

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Cover of: Integrated circuit failure analysis by Friedrich Beck, Friedrich Beck
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Last edited by Open Library Bot
April 28, 2010 | History
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An edition of Integrated circuit failure analysis (1998)

Integrated circuit failure analysis

a guide to preparation techniques

by

  • 2 Want to read
  • 1 Currently reading

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
Wiley
Language
English
Pages
173

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Subjects

Semiconductors, Failures, Testing
Edition Availability
Cover of: Integrated Circuit Failure Analysis
Integrated Circuit Failure Analysis: A Guide to Preparation Techniques
2000, Wiley & Sons, Incorporated, John
in English
Cover of: Integrated circuit failure analysis
Integrated circuit failure analysis: a guide to preparation techniques
1998, Wiley
in English

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Chichester, New York
Series
Wiley series in quality and reliability engineering

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7871.852 .B43 1997, TK7871.852.B43 1997, TK7871.852 .B43 1998

The Physical Object

Pagination
xiv, 173 p. :
Number of pages
173

ID Numbers

Open Library
OL665623M
ISBN 10
0471974013
LCCN
97011255
OCLC/WorldCat
36510050
Library Thing
8832956
Goodreads
3213185

Source records

Library of Congress MARC record
Better World Books record
amazon.com record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 5, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page