Defect oriented testing for CMOS analog and digital circuits

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Last edited by MARC Bot
June 29, 2019 | History

Defect oriented testing for CMOS analog and digital circuits

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Publish Date
Publisher
Kluwer Academic
Language
English
Pages
308

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Previews available in: English

Edition Availability
Cover of: Defect Oriented Testing for CMOS Analog and Digital Circuits
Defect Oriented Testing for CMOS Analog and Digital Circuits
2013, Springer London, Limited
in English
Cover of: Defect oriented testing for CMOS analog and digital circuits
Defect oriented testing for CMOS analog and digital circuits
1998, Kluwer Academic
in English

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Book Details


Edition Notes

Includes bibliographical references and index.

Published in
Boston
Series
Frontiers in electronic testing

Classifications

Dewey Decimal Class
621.3815
Library of Congress
TK7871.99.M44 S23 1998

The Physical Object

Pagination
xiv, 308 p. :
Number of pages
308

ID Numbers

Open Library
OL691883M
Internet Archive
defectorientedte00sach
ISBN 10
0792380835
LCCN
97039048
Goodreads
5551107

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History

Download catalog record: RDF / JSON
June 29, 2019 Edited by MARC Bot import existing book
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 6, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page