An edition of IWSM
(1998)
IWSM
1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
by International Workshop on Statistical Me..., IEEE Electron Devices Society, and Institute of Electrical and Electronics ...
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Last edited by Charles Horn
August 26, 2021 | History
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Subjects
Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Engineering measurement & calibration, Mathematics for scientists & engineers, Technology & Industrial Arts, Engineering Statistics, Very-Large-Scale Integration (Vlsi), Technology, Science/Mathematics, Electronics - Semiconductors, Mensuration, Reference| Edition | Availability |
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1
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, Widerkehr and Associates
Unknown Binding
in English
0780343395 9780780343399
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zzzz
Libraries near you:
WorldCat
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2
IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
1998, IEEE, Widerkehr and Associates
in English
0780343387 9780780343382
|
aaaa
Libraries near you:
WorldCat
|
3
Statistical Metrology, 1998 3rd Workshop
July 1998, Institute of Electrical & Electronics Enginee
Paperback
in English
0780343387 9780780343382
|
zzzz
Libraries near you:
WorldCat
|
Book Details
Edition Notes
Includes bibliographical references.
"IEEE Catalog Number 98EX113"--verso of T.p.
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| August 26, 2021 | Edited by Charles Horn | merge authors |
| July 31, 2019 | Edited by MARC Bot | associate edition with work OL2776376W |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| February 6, 2010 | Edited by WorkBot | add more information to works |
| December 10, 2009 | Created by WorkBot | add works page |