An edition of Noise temperature measurements on wafer (1997)

Noise temperature measurements on wafer

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Noise temperature measurements on wafer
J. Randa, J. Randa
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Last edited by WorkBot
February 7, 2010 | History
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An edition of Noise temperature measurements on wafer (1997)

Noise temperature measurements on wafer

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Publish Date
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Language
English
Pages
57

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Subjects

Electronic noise, Impedance matching, Semiconductor wafers, Current noise (Electricity), Measurement, Testing
Edition Availability
Cover of: Noise temperature measurements on wafer
Noise temperature measurements on wafer
1997, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
in English

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Book Details

Edition Notes

Includes bibliographical references (p. 33-36).
"March 1997."

Published in
Boulder, Colo, Washington
Series
NIST technical note ;, 1390

Classifications

Dewey Decimal Class
602/.18 s, 621.3815/2
Library of Congress
QC100 .U5753 no. 1390, TK7871.85 .U5753 no. 1390

The Physical Object

Pagination
iii, 57 p. :
Number of pages
57

ID Numbers

Open Library
OL775954M
LCCN
97176703

Source records

Library of Congress MARC record

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February 7, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page