An edition of Testability concepts for digital ICs (1995)

Testability concepts for digital ICs

the macro test approach

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Cover of: Testability concepts for digital ICs by F. P. M. Beenker
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Last edited by ImportBot
August 3, 2020 | History
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An edition of Testability concepts for digital ICs (1995)

Testability concepts for digital ICs

the macro test approach

by

  • 0 Ratings
  • 1 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
Kluwer Academic Publishers
Language
English
Pages
212

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Previews available in: English

Subjects
Automatic test equipment, Testing, Digital integrated circuits, Automatic checkout equipment

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Edition Availability
Cover of: Testability concepts for digital ICs
Testability concepts for digital ICs: the macro test approach
1995, Kluwer Academic Publishers
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references (p. 197-205).

Published in
Dordrecht, Boston
Series
Frontiers in electronic testing

Classifications

Dewey Decimal Class
621.3815/48
Library of Congress
TK7874.65 .B44 1995, TK7888.4TK1-9971

The Physical Object

Pagination
ix, 212 p. :
Number of pages
212

ID Numbers

Open Library
OL803687M
Internet Archive
testabilityconce0000been
ISBN 10
0792396588
LCCN
95040166
Goodreads
2140666

Source records

Scriblio MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record
Internet Archive item record
Promise Item

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History

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August 3, 2020 Edited by ImportBot import existing book
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
February 11, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page