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"The investigations presented in this work identify the origin of intrinsic long term charge loss in EPROMs with ONO interploy dielectric and model the charge transport through the ONO dielectric as a function of electric field and temperature"--Abstract.
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Edition | Availability |
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1
Charge loss modeling for EPROMs with ONO interpoly dielectric
1994, Hartung-Gorre Verlag
in English
- 1. Aufl.
3891918364 9783891918364
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Edition Notes
Includes bibliographical references (p. 91-99).
"Nachdruck der Diss. ETH Nr. 10817"--T.p. verso.
Zurich, Techn. Hochsch., Dissertation, 1994.
Abstract in English and German.
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November 20, 2020 | Edited by MARC Bot | import existing book |
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