An edition of Design and testing guides for the CMOS and lateral bipolar-on-SOI test library (1994)

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library

by

Design and testing guides for the CMOS and la ...
J. C. Marshall, J. C. Marshall
Not in Library

My Reading Lists:

Create a new list

Check-In

×Close
Add an optional check-in date. Check-in dates are used to track yearly reading goals.
Today
Notes
Notes

Buy this book

Last edited by Open Library Bot
December 3, 2010 | History
Edit
An edition of Design and testing guides for the CMOS and lateral bipolar-on-SOI test library (1994)

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library

by

This edition doesn't have a description yet. Can you add one?

Publish Date
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Language
English
Pages
132

Buy this book

Subjects

Complementary Metal oxide semiconductors, Computer-aided design, Integrated circuits, Metal oxide semiconductors, Metal oxide semiconductors, Complementary, Silicon-on-insulator technology, Testing, Very large scale integration

Showing 3 featured editions. View all 3 editions?

Edition Availability
Cover of: Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
1994, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English
Cover of: Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
1994, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
in English
  • Not in Library
Cover of: Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library
1994, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.
Microform in English

Add another edition?

Book Details

Edition Notes

Includes bibliographical references (p. 17-18).
"Issued September 1994."

Published in
Gaithersburg, Md, Washington, D.C
Series
Semiconductor measurement technology, NIST special publication ;, 400-93

Classifications

Dewey Decimal Class
602/.18 s, 621.3815/2
Library of Congress
TK7874.75 .M37 1994, QC100.U57 .M37 1994

The Physical Object

Pagination
vi, 132 p. :
Number of pages
132

ID Numbers

Open Library
OL892006M
LCCN
95182312

Source records

Library of Congress MARC record

Community Reviews (0)

Feedback?
No community reviews have been submitted for this work.

Lists

This work does not appear on any lists.

History

Download catalog record: RDF / JSON
December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
February 12, 2010 Edited by WorkBot add more information to works
December 10, 2009 Created by WorkBot add works page