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A novel approach for correlating capacitance data with performance during thin-film device stress studies: preprint
2011, National Renewable Energy Laboratory
electronic resource :
in English
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Edition Notes
Title from title screen (viewed September 19, 2011).
"August 2011."
"Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."
Includes bibliographical references (p. 8).
Sponsored by National Renewable Energy Laboratory DE-AC36-08GO28308
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