Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Antireflecting-chromium linewidth standard, S ...
Carol F. Vezzetti
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Last edited by MARC Bot
November 16, 2020 | History

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

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Cover of: Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English
Cover of: Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
1992, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service]
Microform in English

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Book Details


Edition Notes

Distributed to depository libraries in microfiche.

Shipping list no.: 92-2096-M.

Paper version no longer for sale by the Supt. of Docs.

"Issued January 1992."

Includes bibliographical references.

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.

Published in
Gaithersburg, MD, [Springfield, VA
Series
Standard reference materials, NIST special publication -- 260-117, Standard reference materials, NIST special publication -- 260-117.
Other Titles
Antireflecting chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems.

The Physical Object

Format
Microform
Pagination
xi, 37 p.
Number of pages
37

ID Numbers

Open Library
OL22389274M

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History

Download catalog record: RDF / JSON
November 16, 2020 Edited by MARC Bot import existing book
November 23, 2012 Edited by Anand Chitipothu Reverted spam
November 22, 2012 Edited by 188.190.126.69 Edited without comment.
December 3, 2010 Edited by Open Library Bot Added subjects from MARC records.
December 10, 2009 Created by WorkBot add works page