An edition of Hot-carrier reliability of MOS VLSI circuits (1993)

Hot-carrier reliability of MOS VLSI circuits

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Cover of: Hot-carrier reliability of MOS VLSI circuits by Yusuf Leblebici, Yusuf Leblebici
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Last edited by ImportBot
July 31, 2020 | History
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An edition of Hot-carrier reliability of MOS VLSI circuits (1993)

Hot-carrier reliability of MOS VLSI circuits

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Publish Date
Publisher
Kluwer Academic
Language
English
Pages
212

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Subjects

Defects, Hot carriers, Integrated circuits, Mathematical models, Metal oxide semiconductors, Reliability, Very large scale integration, Integrated circuits, very large scale integration

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Edition Availability
Cover of: Hot-carrier reliability of MOS VLSI circuits
Hot-carrier reliability of MOS VLSI circuits
1993, Kluwer Academic
in English
  • Not in Library
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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
Boston
Series
The Kluwer international series in engineering and computer science ;, SECS 227., VLSI, computer architecture, and digital signal processing, Kluwer international series in engineering and computer science ;, SECS 227., Kluwer international series in engineering and computer science.

Classifications

Dewey Decimal Class
621.39/5
Library of Congress
TK7874 .L334 1993, TK7888.4TK1-9971

The Physical Object

Pagination
xvi, 212 p. :
Number of pages
212

ID Numbers

Open Library
OL1407075M
ISBN 10
079239352X
LCCN
93015447
OCLC/WorldCat
27937993
Goodreads
4302844

Source records

Scriblio MARC record
Library of Congress MARC record
Better World Books record
Library of Congress MARC record
marc_columbia MARC record

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History

Download catalog record: RDF / JSON
July 31, 2020 Edited by ImportBot import existing book
December 4, 2010 Edited by Open Library Bot Added subjects from MARC records.
April 28, 2010 Edited by Open Library Bot Linked existing covers to the work.
December 10, 2009 Created by WorkBot add works page