An edition of International Test Conference 1992
(1992)
International Test Conference 1992
proceedings.
by International Test Conference (1992 Balt...
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Last edited by Open Library Bot
December 4, 2010 | History
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Subjects
Congresses, Integrated circuits, Semiconductors, Testing| Edition | Availability |
|---|---|
1
IEEE International Test Conference
January 31, 1993, I.E.E.E.Press
Hardcover
in English
0780307607 9780780307605
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2
Discover the new world of test and design: International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
1992, Can be ordered from IEEE Service Center
Unknown Binding
in English
0818631678 9780818631672
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3
Proceedings: international test conference, 1992.
1992, The Conference
in English
0780307607 9780780307605
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4
International Test Conference 1992: proceedings.
1992, IEEE Service Center
in English
0818631678 9780818631672
|
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Book Details
Edition Notes
On cover and spine: 1992 IEEE International Test Conference.
"IEEE Catalog Number 92-CH3191-4."
"IEEE Computer Society Press Order Number 3167".
Includes bibliographical references.
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| December 4, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| April 28, 2010 | Edited by Open Library Bot | Linked existing covers to the work. |
| December 10, 2009 | Created by WorkBot | add works page |